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MTI Instruments
Capacitance Sensors

Thank you for your interest in capacitance sensor products from MTI Instruments! If you indicated an interest in more information on a particular product, someone from MTI sales will reach out to you shortly.

Our technical brochures for capacitance sensors are available for download below.

Please feel free to contact our sales department for more information:

Technical Brochures

Digital Capictance SensorACCUMEASURE | Digital Capacitance Sensor
The Accumeasure D capacitance displacement sensor series amplifier converts a highly reliable capacitive electric field measurement (displacement) directly into a 24 bit digital reading to measure position, thickness, motion and vibration. | Download Product Brochure
ACCUMEASURE | AnalogACCUMEASURE | Analog
Accumeasure System 9000 is a high-resolution, capacitance-based instrument that provides the perfect solution to many previously unattainable measurement applications. | Download Product Brochure
ACCUMEASURE BoardACCUMEASURE Board/MicroCap
The Accumeasure MicroCap is a compact, custom designed, OEM capacitance board for high-precision non-contact displacement, thickness and gap measurement. | Download Product Brochure
ACCUMEASURE | Modular Capacitance Rack SystemACCUMEASURE | Modular Capacitance Rack System
The Accumeasure TM 500 compact multi channel capacitance rack system accepts up to 6 capacitance amplifiers.The modular design allows customers to populate the rack with their required number of measurement channels for thickness or single ended displacement measurements. | Download Product Brochure (Accumeasure Series)
Capacitance ProbeCapacitance Probe
MTI offers probes for grounded targets using single-ended probes and for ungrounded or poorly grounded targets using push/pull probes. | Download Product Brochure: For grounded targets | For ungrounded targets
Photovoltaic/Solar | Metrology SystemPhotovoltaic/Solar | Metrology System
A high-speed, multi-channel thickness, TTV and bow measurement module for in-process monitoring of solar/photovoltaic wafers and other materials. | Download Product Brochure
Semiconductor Metrology SystemSemiconductor Metrology System
The Proforma 300i wafer thickness gage is a capacitance-based, differential measurement system that performs non-contact thickness measurements of semiconducting and semi-insulating wafers. | Download Product Brochure
Semi-automated Metrology SystemSemi-automated Metrology System
The Proforma 300SA is a benchtop/desktop, semi-automated wafer measurement system for semi-conducting and semi-insulating materials. Based on MTII’s exclusive Push-Pull capacitance technology, the Proforma 300SA delivers full wafer surface scanning for thickness, thickness variation, bow, warp, sori, site and global flatness. | Download Product Brochure