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Semiconductor/Solar Metrology Systems
Semiconductor/Solar Metrology Systems Manual Semiconductor Metrology System The Proforma 300i wafer thickness gauge is a capacitance-based, differential measurement system that performs non-contact thickness measurements of semiconducting and semi-insulating wafers. View Product Semi-automated Metrology System The Proforma 300iSA is a benchtop/desktop, semi-automated wafer measurement system for semi-conducting and semi-insulating materials delivering full wafer surface scanning for thickness, thickness variation, bow, warp, sori, site and global flatness. View Product WAFER MEASUREMENT TOOL One of the most important components of your electrical devices is the semiconductor wafers that [...]
Accumeasure Wireless Probe Evaluation Kit
Accumeasure Wireless Gap Measurement Probe System Made in the USA Many systems require optimal alignment to work at peak efficiency. The challenge has always been trying to measure gaps in hard to reach places, hazardous environments, and against materials or surfaces that are not ideally suited for eddy current probes. Another issue has been that deploying many of these sensors has traditionally been cost-prohibitive at scale. The solution is a sub-micron displacement measurement probe that has all the features necessary to offer precise measurement in difficult to access locations. Find out how MTI [...]
Thank You for Your Interest in Capacitance Sensors – A
Thank you for your interest! MTI Instruments Capacitance Sensors Thank you for your interest in capacitance sensor products from MTI Instruments! If you indicated an interest in more information on a particular product, someone from MTI sales will reach out to you shortly. Our technical brochures for capacitance sensors are available for download below. Please feel free to contact our sales department for more information: Call Toll-Free: 1-800-342-2203 Email: [email protected] Technical Brochures