Blogs
Webinar: Vitrek Cable & Connector Test & Troubleshooting Solutions GalleryWebinar: Vitrek Cable & Connector Test & Troubleshooting Solutions
Brand-GaGe, Brand-MTI, Brand-Vitrek, Brands-All, News-All Brands, News-Events, News-GaGe, News-Industry, News-MTI, News-Products, Webinars-GaGe, Webinars-Vitrek
Webinar: Vitrek Cable & Connector Test & Troubleshooting Solutions
Complete the form below to register for the webinar. If you have multiple people from your company attending, please have them register individually so that we can send them a copy of the presentation and a link to the recording after the event. [wufoo username="freibergs" formhash="q1de5snk1pvpcb6" autoresize="true" height="1382" header="hide" ssl="true"]
Vitrek Press Release: GaGe Adds New 16-Bit/14-Bit Resolution 2-Channel Models to its Razor Series of High-Speed PCIe Digitizers
GaGe Adds New 16-Bit/14-Bit Resolution 2-Channel Models to its Razor Series of High-Speed PCIe Digitizers Boasting Industry’s Best ENOB New RazorEdge Express 16-bit/14-bit digitizers support A/D sampling rates up to 250 MS/s, while new 14-bit resolution model option is added to existing 16-bit RazorPlus Express with 500 MS/s sampling rate; pricing reduced on 16-bit 500 MS/s RazorPlus/RazorMax Express models; providing best price/performance options aligning with user requirements Lockport, IL—September 6, 2023— GaGe by Vitrek, a US-based manufacturer of high-speed data acquisition and signal recording systems, announces two new versions of its popular Razor Series line of dual-channel (2-CH) [...]
VXI Data Acquisition & Control Instrumentation Software
VXI Data Acquisition & Control Instrumentation Software KineticSystems supplies VXI systems ranging from a few channels tethered to a computer to thousands of channels remotely distributed through Local Area Network (LAN) connections. Whether the VXI instrumentation systems are fixed purpose for specific testing or require flexibility for handling multi-role data acquisition, KineticSystems provides the instrumentation software tools for expedient implementation. VXI Plug-n-Play Device Drivers VXI Device drivers become an extension of the operating system while providing a high-level-language interface (typically C, C++ and/or FORTRAN) between a software application and the registers of a hardware interface. KineticSystems develops VXI device drivers [...]
GaGe CobraMax Limited Time Promotion! Ends 11/30/23
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Whitepaper: Semiconductor Wafer Measurement for Increased Productivity GalleryWhitepaper: Semiconductor Wafer Measurement for Increased Productivity
Brand-GaGe, Brand-MTI, Brand-Vitrek, Brands-All, Industry-Consumer Products, Industry-Electronics, Industry-Manufacturing, Industry-OEM, Industry-Semiconductor, Industry-Semiconductor-MTI, Knowledge Center-MTI, News-Industry, News-MTI, Whitepapers-MTI
Whitepaper: Semiconductor Wafer Measurement for Increased Productivity
Semiconductor Wafer Measurement for Increased Productivity This three-part article describes how manufacturers leverage capacitance-based inspection systems for semiconductor wafers. The article reviews best-practices, consequences of failing to inspect semiconductor wafers and benefits of using semi-automated, fully-automated and manual systems for wafer metrology and inspection. Part 1: Why Disc Geometry Matters in Wafer Production Semiconductor wafers are cut from cylindrical silicon crystals, or ingots. The flatness of these disc-shaped wafers is controlled to tight tolerances to ensure that the entire wafer surface is suitable for integrated circuit (IC) production. If disc geometry is out-of-spec [...]
The Cost of Failing to Inspect Semiconductor Wafers
This is the second of three articles in Semiconductor Wafer Measurement for Increased Profitability. The first article in this series explains why disc geometry matters. The third article describes the benefits of using semi-automated, fully-automated, and manual systems for wafer metrology and inspection. Most semiconductor wafers are made of silicon, the second most common element in the Earth’s crust. Yet, silicon’s abundance does not mean that wafers are inexpensive. The pure form of silicon that’s used in semiconductors does not occur naturally and must be refined and mixed with a dopant that alters material properties and electrical characteristics. Silicon ingots are formed, wafers [...]
Educational Discount Inquiry!
Thank you for your interest in Vitrek's Discount Program for Educational Facilities! Please complete the form below and we will have one of our experts contact you regarding your application! [wufoo username="freibergs" formhash="qpqopm51wrrrw5" autoresize="true" height="1436" header="show" ssl="true"]
Press Release: New Vitrek Website Presents Comprehensive Details of Company’s Test & Measurement Product Portfolio
New Vitrek Website Presents Comprehensive Details of Company’s Test & Measurement Product Portfolio Interactive menus provide easy access to products by type and application: test & measurement instruments, high-speed data acquisition & signal recording, metrology, signal simulation, and jet engine vibration testing systems. Poway, CA—August 10, 2023—Vitrek, a major manufacturer of precision electrical safety testing equipment, high-speed data acquisition and signal recording, and advanced metrology and simulation instruments and systems, announces the launch of its fully redesigned and expanded website. The new website at vitrek.com provides easy navigation of the company’s extensive product portfolio. Its intuitive menu [...]
Capacitance Probe Detects Water Contamination in Oiling Systems
Capacitance Probe Detects Water Contamination in Oiling Systems Industrial, Research & Development Capacitance Probe Detection of Water Contamination Metrology, Tolerances Description [Application Note 12218]  The adverse effects of water in oil are well known. Negative consequences include higher viscosity reduced load carrying ability hydrolysis (the formation of acids, sludge, and varnish) foam formation and air entrainment additive depletion corrosion on metal surfaces loss of lubrication film strength leading to increased wear cavitations filter plugging Problem As oil system reliability decreases, maintenance and repair activities increase. Corrective action must be taken [...]
Signal Generator Simulates Eddy Current Probe
Signal Generator Simulates Eddy Current Probe Industrial, Power Generation, Automotive, Power Generation, R& D, Solar Simulation of Eddy Current Probe Gap, Amplitude, Displacement, Positioning, Thickness Description [Application Note 31218] Non-contact eddy current probes can be used to measure the position, or position change, of conductive targets in real time. Typical monitoring applications include shaft runout and/or vibration. Probe setup requires an oscillator demodulator circuit. This circuit converts the probe’s magnetic field readings into output voltages proportional to the gap between probe and target. Portal signal conditioning electronics are then used [...]